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An inside look: Innovation, automotive test, and what's next

Mentor, Aug. 23, 2018 – "Our innovations move beyond mere ideas to become convincing products that conquer markets and set benchmarks."

Janusz Rajski, industry luminary and VP of engineering in Mentor's Tessent test group, presented a keynote at ITC Asia on DFT for automotive reliability. Rajski has years of success in innovating new DFT technologies. He led the development of the industry's first embedded test compression and of Cell-aware test.

The development of advanced driver assistance systems is fueling the growth of the automotive IC market. One of the biggest challenges in this area is the requirement to ensure functional safety. Where there is an industry need, there will be technological innovation.Rajski focused his keynote on new design-for-test (DFT) solutions that are already being used by leading companies as well as emerging technologies that will be needed to ensure long-term reliability of ICs implemented in new technology nodes. Advanced technology nodes are more complex than what the automotive industry typically used, and introduce new defect types and reliability risks.

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