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7nm, 5nm and 3nm Logic, current and projected processes


Jun. 25, 2018 – 

There has been a lot of new information available about the leading-edge logic processes lately. Papers from IEDM in December 2017, VLSIT this month, the TSMC and Samsung Foundry forums, etc. have all filled in a lot of information. In this article I will summarize what is currently known.

Process Metrics

Standard cells are used to design logic circuits and the size of standard cells is determined by Contacted Poly Pitch (CPP), Metal 2 Pitch (M2P) and Tracks (number of M2P in the cell height).

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