Self-testing in embedded systems: Hardware failure

by Colin Walls, Embedded.com, Feb. 09, 2016 – 

All electronic systems carry the possibility of failure. An embedded system has intrinsic intelligence that facilitates the possibility of predicting failure and mitigating its effects. This two-part series reviews the options for self-testing that are open to the embedded software developer, along with testing algorithms for memory and some ideas for self-monitoring software in multi-tasking and multi-CPU systems. In this first part, we look at self-testing approaches to guard against hardware failure. In part two, we'll look at self-testing methods that address software malfunctions.

Embedded software can be incredibly complex, so the possibilities for something going wrong are extensive. Add to this the complexity and potential unreliability of hardware, and system failure seems almost inevitable. And yet, most systems are amazingly reliable, functioning faultlessly for months at a time. This is no accident. The reliability comes about through careful design in the first place and a tacit acceptance of the possibility of failure in the second.

Writing robust software, that is less likely to exhibit failure requires three issues to be considered:

 Back