Verification is key as automotive chip design goes 28nm

IC design house Sondrel says that automotive SoC design is now starting to focus around the 28nm process node.

By Richard Wilson - Electronics Weekly, Jan. 27, 2016 – 

This is now a well-established and high yield node and so will support the automotive sector's need for dielectric isolation (leakage current v speed trade off).

This will mean that IC designers must address the design rules associated with:

• High Temperature Operating Life (HOTL)
• Automotive Safety Integrity levels (ISO26262 ASIL A-D)
• Testing the design to a reliability prediction program, (SN29500/TR62380)

Sondrel says that designers must start as early as possible in the design process with a robust verification strategy.

It has described the key verification and design for manufacture techniques in a white paper:

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